Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip - nouveau livre

EAN (ISBN-13): 9781461422969
ISBN (ISBN-10): 1461422965
Date de parution: 2012
Editeur: Springer New York
187 Pages
Langue: eng/Englisch

Livre dans la base de données depuis 2012-08-26T19:23:37+02:00 (Zurich)
Page de détail modifiée en dernier sur 2023-10-21T18:54:34+02:00 (Zurich)
ISBN/EAN: 1461422965

ISBN - Autres types d'écriture:
1-4614-2296-5, 978-1-4614-2296-9
Autres types d'écriture et termes associés:
Auteur du livre: josé silva, jose silva, martinez, martí josé, jose marti, ona
Titre du livre: around the circuit, chip, analog circuit design, variation, design systems, process design

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Données de l'éditeur

Auteur: Marvin Onabajo; Jose Silva-Martinez
Titre: Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip
Editeur: Springer; Springer US
174 Pages
Date de parution: 2012-03-08
New York; NY; US
Imprimé / Fabriqué en
Langue: Anglais
96,29 € (DE)
99,00 € (AT)
118,00 CHF (CH)
Available
XVIII, 174 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Analog performance tuning; Built-in Testing; Digitally-assisted performance tuning; Mismatch Reduction; On-chip measurement circuits; System on Chip; Variation-Tolerant Analog Circuit Design; B; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Processor Architectures; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Processor Architectures; Engineering; Elektronik; Rechnerarchitektur und Logik-Entwurf; BB

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.    Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.