Progress in Transmission Electron Microscopy 2 : Applications in Materials Science - Livres de poche
2010, ISBN: 3642087183
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2010, ISBN: 3642087183
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ISBN: 9783642087189
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many asp… Plus…
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2010, ISBN: 3642087183
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Softcover reprint of hardcover 1st ed. 2001 Kartoniert / Broschiert Wissenschaftliche Standards, Normung usw., Nanotechnologie, Materialwissenschaft, mit Schutzumschlag 11, [PU:Springer… Plus…
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2010, ISBN: 9783642087189
Livres de poche
Applications in Materials Science, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2001, [PU: Springer Berlin], Springer Berlin, 2010
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Progress in Transmission Electron Microscopy 2 : Applications in Materials Science - Livres de poche
2010, ISBN: 3642087183
[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg], Druck auf Anfrage Neuware - Printed after ordering - Transmission electron microscopy (TEM) is now recognized as a crucial… Plus…
2010, ISBN: 3642087183
[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg Okt 2010], This item is printed on demand - it takes 3-4 days longer - Neuware -Transmission electron microscopy (TEM) is no… Plus…
ISBN: 9783642087189
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many asp… Plus…
2010, ISBN: 3642087183
Edition reliée
Softcover reprint of hardcover 1st ed. 2001 Kartoniert / Broschiert Wissenschaftliche Standards, Normung usw., Nanotechnologie, Materialwissenschaft, mit Schutzumschlag 11, [PU:Springer… Plus…
2010, ISBN: 9783642087189
Livres de poche
Applications in Materials Science, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2001, [PU: Springer Berlin], Springer Berlin, 2010
Données bibliographiques du meilleur livre correspondant
| Auteur: | |
| Titre: | |
| ISBN: |
Informations détaillées sur le livre - Progress in Transmission Electron Microscopy 2: Applications in Materials Science Xiao-Feng Zhang Editor
EAN (ISBN-13): 9783642087189
ISBN (ISBN-10): 3642087183
Version reliée
Livre de poche
Date de parution: 2010
Editeur: Springer Berlin Heidelberg Core >1 >T
328 Pages
Poids: 0,497 kg
Langue: eng/Englisch
Livre dans la base de données depuis 2011-02-05T11:39:57+01:00 (Zurich)
Page de détail modifiée en dernier sur 2024-01-11T21:28:33+01:00 (Zurich)
ISBN/EAN: 3642087183
ISBN - Autres types d'écriture:
3-642-08718-3, 978-3-642-08718-9
Autres types d'écriture et termes associés:
Auteur du livre: zhang xiao, zhang feng
Titre du livre: progress materials science, transmission, electron microscopy, surface science series
Données de l'éditeur
Auteur: Xiao-Feng Zhang; Ze Zhang
Titre: Springer Series in Surface Sciences; Progress in Transmission Electron Microscopy 2 - Applications in Materials Science
Editeur: Springer; Springer Berlin
307 Pages
Date de parution: 2010-10-19
Berlin; Heidelberg; DE
Imprimé / Fabriqué en
Langue: Anglais
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XIV, 307 p.
BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Materialwissenschaft; Verstehen; Surfaces, Interfaces and Thin Film; Measurement Science and Instrumentation; Nanotechnology; Characterization and Analytical Technique; Wissenschaftliche Standards, Normung usw. Nanotechnologie; Werkstoffprüfung; BB
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.Reviews the modern developments that have made transmission electron microscopy indispensible for materials research Includes supplementary material: sn.pub/extras
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