ISBN: 9789048194315
Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Plus…
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Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Plus…
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ISBN: 9789048194315
Here is a comprehensive guide of the NAND world: from circuits design to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from err… Plus…
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ISBN: 9789048194315
Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Plus…
ISBN: 9789048194315
Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Plus…
ISBN: 9789048194315
Here is a comprehensive guide of the NAND world: from circuits design to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from err… Plus…
ISBN: 9789048194315
*Inside NAND Flash Memories* / pdf eBook für 223.49 € / Aus dem Bereich: eBooks, Fachthemen & Wissenschaft, Wissenschaften, allgemein Medien > Bücher nein eBook als pdf eBooks > Fachtheme… Plus…
ISBN: 9789048194315
Inside NAND Flash Memories: ab 223.49 € eBooks > Fachthemen & Wissenschaft > Wissenschaften allgemein Springer-Verlag GmbH eBook als pdf, Springer-Verlag GmbH
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Informations détaillées sur le livre - Inside NAND Flash Memories Rino Micheloni Author
EAN (ISBN-13): 9789048194315
ISBN (ISBN-10): 9048194318
Date de parution: 2010
Editeur: Springer-Verlag New York, LLC Digital >16
600 Pages
Langue: eng/Englisch
Livre dans la base de données depuis 2011-08-02T10:12:37+02:00 (Zurich)
Page de détail modifiée en dernier sur 2024-03-16T15:04:09+01:00 (Zurich)
ISBN/EAN: 9048194318
ISBN - Autres types d'écriture:
90-481-9431-8, 978-90-481-9431-5
Autres types d'écriture et termes associés:
Auteur du livre: luca crippa, marelli
Titre du livre: flash, inside outside, look inside, memories
Données de l'éditeur
Auteur: Rino Micheloni; Luca Crippa; Alessia Marelli
Titre: Inside NAND Flash Memories
Editeur: Springer; Springer Netherland
582 Pages
Date de parution: 2010-07-27
Dordrecht; NL
Langue: Anglais
234,33 € (DE)
240,90 € (AT)
271,50 CHF (CH)
Available
X, 582 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Devices; Flash Memories; NAND Memories; Solid State Circuits; integrated circuit; single-electron transistor; static-induction transistor; C; Electronic Circuits and Systems; Mass Spectrometry; Condensed Matter Physics; Spectroscopy; Engineering; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC
Preface. Acknowledgements. 1 Market and applications for NAND flash memories; Gregory Wong. 2 NAND overview: from memory to systems; R. Micheloni, A. Marelli and S. Commodaro. 3 Program and erase of NAND memory arrays; Cristoph Friederich. 4 Reliability issues of NAND flash memories; C. Zambelli, A. Chimenton and P. Olivo. 5 Charge trap NAND technologies ; Alessandro Grossi. 6 Control logic; A. Marelli, R. Micheloni and R. Ravasio. 7 NAND DDR interface; Andrea Silvagni. 8 Sensing circuits; L. Crippa and R. Micheloni. 9 Parasitic effects and verify circuits; L. Crippa and R. Micheloni. 10 MLC storage; L. Crippa and R. Micheloni. 11 Charge pumps, voltage regulators and HV switches; R. Micheloni and L. Crippa. 12 High voltage overview; R. Micheloni and A. Marelli. 13 Redundancy; A. Marelli and R. Micheloni . 14 Error correction codes; T. Zhang, A. Marelli and R. Micheloni. 15 NAND design for testability and testing; Andrea Silvagni. 16 XLC storage; R. Micheloni and L. Crippa. 17 Flash cards; A. Ghilardelli and S. Corno. 18 Low power 3D-integrated SSD; K. Takeuchi. 19 Radiation effects on NAND Flash memories; M. Bagatin, G. Cellere, S. Gerardin and A. Paccagnella. About the authors. Index.Flash NAND design NAND – SSD co-development Radiation effects on Flash memories Charge trap technology overview Includes supplementary material: sn.pub/extras
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