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ISBN: 9780470227220

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including ge… Plus…

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He, Bob B.:

Two-Dimensional X-Ray Diffraction - edition reliée, livre de poche

2009, ISBN: 0470227222

[EAN: 9780470227220], Gebraucht, guter Zustand, [PU: Wiley], A+ Customer service! Satisfaction Guaranteed! Book is in Used-Good condition. Pages and cover are clean and intact. Used items… Plus…

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He, Bob B.:
Two-Dimensional X-Ray Diffraction - edition reliée, livre de poche

2009

ISBN: 0470227222

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Two-Dimensional X-Ray Diffraction - edition reliée, livre de poche

2009, ISBN: 9780470227220

Hardcover, Access codes and supplements are not guaranteed with used items. May be an ex-library book., Gebraucht, guter Zustand, [PU: Wiley]

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Two-Dimensional X-Ray Diffraction - edition reliée, livre de poche

2009, ISBN: 0470227222

[EAN: 9780470227220], Gebraucht, wie neu, [PU: Wiley], Like New, Books

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Two-dimensional X-ray Diffraction

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.

Informations détaillées sur le livre - Two-dimensional X-ray Diffraction


EAN (ISBN-13): 9780470227220
ISBN (ISBN-10): 0470227222
Version reliée
Date de parution: 2009
Editeur: Wiley
426 Pages
Poids: 0,721 kg
Langue: eng/Englisch

Livre dans la base de données depuis 2009-09-27T13:57:12+02:00 (Zurich)
Page de détail modifiée en dernier sur 2022-06-28T15:40:11+02:00 (Zurich)
ISBN/EAN: 9780470227220

ISBN - Autres types d'écriture:
0-470-22722-2, 978-0-470-22722-0
Autres types d'écriture et termes associés:
Titre du livre: ray


Données de l'éditeur

Auteur: B. B. He
Titre: Two-dimensional X-ray Diffraction
Editeur: John Wiley & Sons
426 Pages
Date de parution: 2009-09-04
Poids: 0,710 kg
Langue: Anglais
165,00 € (DE)
No longer receiving updates
164mm x 239mm x 24mm

BB; Hardcover, Softcover / Chemie; Analytische Chemie; Analytical Chemistry; Analytische Chemie; Chemie; Chemistry; Materials Science; Materialwissenschaften; Pharmaceutical & Medicinal Chemistry; Pharmazeutische u. Medizinische Chemie; Röntgenbeugung; Analytische Chemie; Pharmazeutische u. Medizinische Chemie; Allg. Materialwissenschaften

Preface. 1. Introduction. 1.1 X-Ray Technology and Its Brief History. 1.2 Geometry of Crystals. 1.3 Principles of X-Ray Diffraction. 1.4 Reciprocal Space and Diffraction. 1.5 Two-Dimensional X-Ray Diffraction. 2. Geometry Conventions. 2.1 Introduction. 2.2 Diffraction Space and Laboratory Coordinates. 2.3 Detector Space and Detector Geometry. 2.4 Sample Space and Goniometer Geometry. 2.5 Transformation from Diffraction Space to Sample Space. 2.6 Summary of XRD2 Geometry. References. 3. X-Ray Source and Optics. 3.1 X-Ray Generation and Characteristics. 3.2 X-Ray Optics. References. 4. X-Ray Detectors. 4.1 History of X-Ray Detection Technology. 4.2 Point Detectors in Conventional Diffractometers. 4.3 Characteristics of Point Detectors. 4.4 Line Detectors. 4.5 Characteristics of Area Detectors. 4.6 Types of Area Detectors. 5. Goniometer and Sample Stages. 5.1 Goniometer and Sample Position. 5.2 Goniometer Accuracy. 5.3 Sample Alignment and Visualization Systems. 5.4 Environment Stages. References. 6. Data Treatment. 6.1 Introduction. 6.2 Nonuniform Response Correction. 6.3 Spatial Correction. 6.4 Detector Position Accuracy and Calibration. 6.5 Frame Integration. 6.6 Lorentz, Polarization, and Absorption Corrections. 7. Phase Identification. 7.1 Introduction. 7.2 Relative Intensity. 7.3 Geometry and Resolution. 7.4 Sampling Statistics. 7.5 Preferred Orientation Effect. References. 8. Texture Analysis. 8.1 Introduction. 8.2 Pole Density and Pole Figure. 8.3 Fundamental Equations. 8.4 Data Collection Strategy. 8.5 Texture Data Process. 8.6 Orientation Distribution Function. 8.7 Fiber Texture. 8.8 Other Advantages of XRD2 for Texture. References. 9. Stress Measurement. 9.1 Introduction. 9.2 Principle of X-Ray Stress Analysis. 9.3 Theory of Stress Analysis with XRD2. 9.4 Process of Stress Measurement with XRD2. 9.5 Experimental Examples. Appendix 9.A Calculation of Principal Stresses from the General Stress Tensor. Appendix 9.B Parameters for Stress Measurement. References. 10. Small-Angle X-Ray Scattering. 10.1 Introduction. 10.2 2D SAXS Systems. 10.3 Application Examples. 10.4 Some Innovations in 2D SAXS. References. 11. Combinatorial Screening. 11.1 Introduction. 11.2 XRD2 Systems for Combinatorial Screening. 11.3 Combined Screening with XRD2 and Raman. 12. Quantitative Analysis. 12.1 Percent Crystallinity. 12.2 Crystal Size. 12.3 Retained Austenite. References. 13. Innovation and Future Development. 13.1 Introduction. 13.2 Scanning Line Detector for XRD2. 13.3 Three-Dimensional Detector. 13.4 Pixel Direct Diffraction Analysis. References. Appendix A. Values of Commonly Used Parameters. Appendix B. Symbols. Index.

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