ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Plus…
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ISBN: 9780470511374
ESD : Failure Mechanisms and Models, Hardcover by Voldman, Steven H., ISBN 0470511370, ISBN-13 9780470511374, Like New Used, Free shipping in the USElectrostatic discharge (ESD) failure m… Plus…
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2009, ISBN: 0470511370
[EAN: 9780470511374], Nieuw boek, [SC: 1.14], [PU: John Wiley & Sons Inc, United States], Language: English. Brand new Book. Electrostatic discharge (ESD) failure mechanisms continue to i… Plus…
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ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Plus…
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ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Plus…
Voldman, Steven H.:
ESD : Failure Mechanisms and Models, Hardcover by Voldman, Steven H., Like Ne... - livre d'occasionISBN: 9780470511374
ESD : Failure Mechanisms and Models, Hardcover by Voldman, Steven H., ISBN 0470511370, ISBN-13 9780470511374, Like New Used, Free shipping in the USElectrostatic discharge (ESD) failure m… Plus…
2009
ISBN: 0470511370
[EAN: 9780470511374], Nieuw boek, [SC: 1.14], [PU: John Wiley & Sons Inc, United States], Language: English. Brand new Book. Electrostatic discharge (ESD) failure mechanisms continue to i… Plus…
ISBN: 9780470511374
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrica… Plus…
2009, ISBN: 0470511370
[EAN: 9780470511374], Neubuch, [PU: John Wiley & Sons Inc, United States], Language: English. Brand new Book. Electrostatic discharge (ESD) failure mechanisms continue to impact semicondu… Plus…
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Informations détaillées sur le livre - ESD: Failure Mechanisms and Models Steven H. Voldman Author
EAN (ISBN-13): 9780470511374
ISBN (ISBN-10): 0470511370
Version reliée
Date de parution: 2009
Editeur: Wiley Core >2 >T
384 Pages
Poids: 0,816 kg
Langue: eng/Englisch
Livre dans la base de données depuis 2008-03-18T10:54:46+01:00 (Zurich)
Page de détail modifiée en dernier sur 2024-03-31T08:59:42+02:00 (Zurich)
ISBN/EAN: 9780470511374
ISBN - Autres types d'écriture:
0-470-51137-0, 978-0-470-51137-4
Autres types d'écriture et termes associés:
Auteur du livre: voldman
Titre du livre: esd, models failure
Données de l'éditeur
Auteur: Steven H. Voldman
Titre: ESD - Failure Mechanisms and Models
Editeur: Wiley; John Wiley & Sons
408 Pages
Date de parution: 2009-07-17
Poids: 0,818 kg
Langue: Anglais
129,00 € (DE)
Not available (reason unspecified)
168mm x 244mm x 27mm
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Circuit Theory & Design; Components & Devices; Electrical & Electronics Engineering; Elektrotechnik u. Elektronik; Halbleiter; Komponenten u. Bauelemente; Schaltkreise - Theorie u. Entwurf; Schaltkreistechnik; Semiconductors; Schaltkreise - Theorie u. Entwurf; Komponenten u. Bauelemente; Halbleiter
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. Look inside for extensive coverage on: * failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems; * electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, gallium arsenide (GaAs), gallium nitride (GaN), magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR), devices; micro electro-mechanical (MEM) systems, and photo-masks and reticles; * practical methods to use failure analysis for the understanding of ESD circuit operation, temperature analysis, power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics, (connecting the theoretical to the practical analysis); * the failure of each key element of a technology from passives, active elements to the circuit, sub-system to package, illusterated with case studies of the elements, circuits and system-on-chip (SOC) in today's products. ESD: Failure Mechanisms and Models is a continuation of the author's series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.Autres livres qui pourraient ressembler au livre recherché:
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