ISBN: 9781441909312

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes.The reliable operation of integrated circuits (ICs) has become increasingly… Plus…

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes.The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era.With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly.Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors.Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits.Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits.Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations.The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.; PDF; Scientific, Technical and Medical > Electronics & communications engineering > Electronics engineeri, Springer US<

ISBN: 9781441909312

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… Plus…

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant., Springer<

2009, ISBN: 9781441909312

Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Verkaufsrang: 3939836, Drafting & Presentation, Architectu… Plus…

Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Verkaufsrang: 3939836, Drafting & Presentation, Architecture, Arts & Photography, Subjects, Books, CAD, Graphics & Design, Computers & Technology, Circuits, Electrical & Electronics, Engineering & Transportation, Specialty Boutique, Graphic Design, Kindle eBooks, Categories, Kindle Store, Computer Science, Kindle eTextbooks, Specialty Stores, Selection Test A1VC38T7YXB528, Selection Test ATVPDKIKX0DER, Selection Test A3UN6WX5RRO2AG, Selection Test A1PA6795UKMFR9, Selection Test A1F83G8C2ARO7P, Selection Test A13V1IB3VIYZZH, Selection Test A3AEGXETSR30VB, Selection Test A3P5ROKL5A1OLE, Selection Test A3JWKAKR8XB7XF, Selection Test A3R76HOPU0Z2CB, Selection Test A1IM4EOPHS76S7, Selection Test A138L1TOL8PIJT, Selection Test A3T4TT2Z381HKD, Selection Test A3LJ5WMKNRFKQS, English Language Store, Format: Kindle eBook, Springer, 2009<

2009, ISBN: 9781441909312

Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Computer Aided Design, Graphics & Multimedia, Software & G… Plus…

Springer, Kindle Edition, Auflage: 2010, 234 Seiten, Publiziert: 2009-10-22T00:00:00.000Z, Produktgruppe: Digital Ebook Purchas, Computer Aided Design, Graphics & Multimedia, Software & Graphics, Computing & Internet, Subjects, Books, Circuits, Electronics Engineering, Electronics & Communications Engineering, Engineering & Technology, Science, Nature & Maths, Electronics & Telecommunications Engineering, Scientific, Technical & Medical, CAD-CAM, Graphic Design, Kindle eBooks, Categories, Kindle Store, Technology & Engineering, Professional & Technical, Format: Kindle eBook, Springer, 2009<

ISBN: 9781441909312

VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, prese… Plus…

VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems.; PDF; Scientific, Technical and Medical > Electronics & communications engineering > Electronics engineeri, Cambridge Scholars Publishing<