Handbook of Microscopy, Handbook of Microscopy : Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II - nouveau livre
ISBN: 9783527620531
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the ph… Plus…
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2008, ISBN: 9783527620531
Applications in Materials Science, Solid-State Physics, and Chemistry, Methods II, eBooks, eBook Download (PDF), Auflage, [PU: Wiley-VCH], [ED: 1], Wiley-VCH, 2008
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2008, ISBN: 9783527620531
Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II, eBooks, eBook Download (PDF), 1. Auflage, [PU: Wiley-VCH], Wiley-VCH, 2008
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ISBN: 9783527620531
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Handbook of Microscopy, Handbook of Microscopy : Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II - nouveau livre
ISBN: 9783527620531
Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the ph… Plus…
ISBN: 9783527620531
*Handbook of Microscopy* - Applications in Materials Science Solid-State Physics and Chemistry. Methods II / pdf eBook für 304.99 € / Aus dem Bereich: eBooks, Fachthemen & Wissenschaft, W… Plus…
2008
ISBN: 9783527620531
Applications in Materials Science, Solid-State Physics, and Chemistry, Methods II, eBooks, eBook Download (PDF), Auflage, [PU: Wiley-VCH], [ED: 1], Wiley-VCH, 2008
2008, ISBN: 9783527620531
Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II, eBooks, eBook Download (PDF), 1. Auflage, [PU: Wiley-VCH], Wiley-VCH, 2008
ISBN: 9783527620531
Handbook of Microscopy - Applications in Materials Science Solid-State Physics and Chemistry. Methods II: ab 304.99 € eBooks > Fachthemen & Wissenschaft > Wissenschaften allgemein Wiley-V… Plus…
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Informations détaillées sur le livre - Handbook of Microscopy
EAN (ISBN-13): 9783527620531
ISBN (ISBN-10): 3527620532
Date de parution: 2008
Editeur: Wiley-VCH GmbH
507 Pages
Langue: eng/Englisch
Livre dans la base de données depuis 2007-01-17T21:44:36+01:00 (Zurich)
Page de détail modifiée en dernier sur 2023-09-28T04:08:30+02:00 (Zurich)
ISBN/EAN: 9783527620531
ISBN - Autres types d'écriture:
3-527-62053-2, 978-3-527-62053-1
Autres types d'écriture et termes associés:
Auteur du livre: markus wolf, van dyck, amelin, amelinckx
Titre du livre: solid state physics, handbook chemistry and physics, applications chemistry, handbook microscopy applications materials science
Données de l'éditeur
Auteur: S. Amelinckx
Titre: Handbook of Microscopy - Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II
Editeur: Wiley-VCH; Wiley-VCH
482 Pages
Date de parution: 2008-07-11
Langue: Anglais
304,99 € (DE)
EA; E107; E-Book; Nonbooks, PBS / Chemie; Materialwissenschaft; Verstehen; Analytical Chemistry; Analytische Chemie; Chemie; Chemistry; Dünne Schichten, Oberflächen u. Grenzflächen; Festkörperchemie; Festkörperphysik; Materials Characterization; Materials Science; Materialwissenschaften; Physics; Physik; Physik, Astronomie / Elektrizität, Magnetismus, Optik; Solid State Chemistry; Solid State Physics; Thin Films, Surfaces & Interfaces; Werkstoffprüfung; Analytische Chemie; Festkörperchemie; Allg. Materialwissenschaften; Dünne Schichten, Oberflächen u. Grenzflächen; Werkstoffprüfung; Festkörperphysik; BB
METHODS I: LIGHT MICROSCOPY Reflection Microscopy Transmission Microscopy Raman Microscopy Three-dimensional Light Microscopy Near Field Light Microscopy Infrared Microscopy X-RAY MICROSCOPY Soft X-ray Imaging X-ray Microradiography X-ray Microtomography X-ray Holographic Imaging X-ray Topography ACOUSTIC MICROSCOPY Scanning Acoustic Microscopy Photoacoustic Microscopy Electron Acoustic Microscopy Scanning Laser Acoustic Microscopy ELECTRON MICROSCOPY Stationary Beam Methods METHODS II: ELECTRON MICROSCOPY Scanning Beam Methods Magnetic Methods: NMR-Microscopy Scanning Electron Microscopy with Polarization Analysis (SEMPA) EMISSION METHODS Photoemission Electron Microscopy Field Emission Microscopy (FEM) Field Ion Microscopy SCANNING POINT PROBE TECHNIQUES Scanning Tunnelling Microscopy STM Atomic Force Microscopy AFM Magnetic Force Microscopy MFM Ballistic Electron Emission Microscopy (BEEM) Methods Under Development IMAGE RECORDING HANDLING AND PROCESSING Electronic Image Recording Image Processing SPECIAL TOPICS Coincidence Microscopy Low Energy Holography APPLICATIONS: CLASSES OF MATERIALS Metals and Alloys Rocks and Minerals Semiconductors and Semiconducting Devices Opto-electronic Materials Ferroic Materials Structural Ceramics Gemmological Applications Superconductors: Intermetallics and Ceramics Nonperiodic Structures Dental and Biomaterials Application of TEM and SAED Different Forms of Carbon Composite Structural Materials Polymers Nuclear Materials Magnetic Materials SPECIAL TOPICS Phase Transformations Specimen Preparation Techniques Environmental Problems Thin Film Growth Quantitative HyleographyAutres livres qui pourraient ressembler au livre recherché:
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