ISBN: 9783540922612
This second volume of the Charged Particle Traps deals with the rapidly expanding body of research exploiting the electromagnetic con?nement of ions, whose principles and techniques were … Plus…
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ISBN: 9783540922612
Here is the second volume of this publication, devoted to the applications of this technology, and complementing the first volume's comprehensive treatment of the theory and practice of c… Plus…
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ISBN: 9783540922612
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ISBN: 9783540922612
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2009, ISBN: 9783540922612
Applications, eBooks, eBook Download (PDF), 2009, [PU: Springer Berlin], Seiten: 276, Springer Berlin, 2009
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ISBN: 9783540922612
This second volume of the Charged Particle Traps deals with the rapidly expanding body of research exploiting the electromagnetic con?nement of ions, whose principles and techniques were … Plus…
ISBN: 9783540922612
Here is the second volume of this publication, devoted to the applications of this technology, and complementing the first volume's comprehensive treatment of the theory and practice of c… Plus…
ISBN: 9783540922612
*Charged Particle Traps II* - Applications / pdf eBook für 96.49 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Technik Medien > Bücher nein eBook als pdf eBooks > Sachthemen & Ratge… Plus…
ISBN: 9783540922612
Charged Particle Traps II - Applications: ab 96.49 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH eBook als pdf, Springer-Verlag GmbH
2009, ISBN: 9783540922612
Applications, eBooks, eBook Download (PDF), 2009, [PU: Springer Berlin], Seiten: 276, Springer Berlin, 2009
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Informations détaillées sur le livre - Charged Particle Traps II
EAN (ISBN-13): 9783540922612
ISBN (ISBN-10): 354092261X
Date de parution: 2009
Editeur: Springer Berlin
276 Pages
Langue: eng/Englisch
Livre dans la base de données depuis 2011-08-23T21:22:34+02:00 (Zurich)
Page de détail modifiée en dernier sur 2023-10-10T15:03:26+02:00 (Zurich)
ISBN/EAN: 9783540922612
ISBN - Autres types d'écriture:
3-540-92261-X, 978-3-540-92261-2
Autres types d'écriture et termes associés:
Auteur du livre: günther, werth, ghe
Données de l'éditeur
Auteur: Günther Werth; Viorica N. Gheorghe; Fouad G. Major
Titre: Springer Series in Atomic, Optical, and Plasma Physics; Charged Particle Traps II - Applications
Editeur: Springer; Springer Berlin
276 Pages
Date de parution: 2009-09-16
Berlin; Heidelberg; DE
Langue: Anglais
96,29 € (DE)
99,00 € (AT)
118,00 CHF (CH)
Available
X, 276 p. 200 illus., 1 illus. in color.
EA; E107; eBook; Nonbooks, PBS / Physik, Astronomie/Atomphysik, Kernphysik; Atom- und Molekularphysik; Verstehen; Charged particle trapping; Hyperfine structure and g-factor measurements; Ion trap atomic clocks; Ion trap quantum computing; Lifetimes of excited states; collision; metastable; particles; B; Atomic, Molecular and Chemical Physics; Nuclear Energy; Atoms and molecules in external fields; Plasma Physics; Measurement Science and Instrumentation; Physics and Astronomy; Kernenergie und Kerntechnik (Nuklearenergie, Nukleartechnik); Plasmaphysik; Wissenschaftliche Standards, Normung usw. BB
Electromagnetic Trap Properties.- Summary of Trap Properties.- Mass Spectrometry.- Mass Spectrometry Using Paul Traps.- Mass Spectroscopy in Penning Trap.- Spectroscopy with Trapped Charged Particles.- Microwave Spectroscopy.- Optical Spectroscopy.- Lifetime Studies in Traps.- Quantum Topics.- Quantum Effects in Charged Particle Traps.- Quantum Computing with Trapped Charged Particles.Only book on charged particle traps Summarizing all the knowledge in this field Valuable reference for researchers Useful textbook for graduate students Includes supplementary material: sn.pub/extras
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9783642260421 Charged Particle Traps II (Werth, Günther;Gheorghe, Viorica N.;Major, Fouad G.)
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