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Fringe 2013 : 7th International Workshop on Advanced Optical Imaging and Metrology - edition reliée, livre de poche

2013, ISBN: 364236358X

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Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology - edition reliée, livre de poche

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Springer, Gebundene Ausgabe, Auflage: 2014, 1002 Seiten, Publiziert: 2013-08-29T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 700 black & white illustrations, 39.57 kg, Grafik & Multime… Plus…

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Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology - edition reliée, livre de poche

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Springer, Gebundene Ausgabe, Auflage: 2014, 1002 Seiten, Publiziert: 2013-08-29T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 700 black & white illustrations, 39.57 kg, Grafik & Multime… Plus…

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Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology - edition reliée, livre de poche

2013, ISBN: 364236358X

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Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology
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ISBN:

9783642363580


In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are:
- New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution)
- Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time)
- High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano)
- Hybrid technologies in Optical Imaging and Metrology
(hybrid optics, sensor and data fusion, model-based solutions, multimodality)
- New optical sensors, imaging and measurement systems
(integrated, miniaturized, in-line, real-time, traceable, remote)

Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.

Informations détaillées sur le livre - Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology


EAN (ISBN-13): 9783642363580
ISBN (ISBN-10): 364236358X
Version reliée
Livre de poche
Date de parution: 2013
Editeur: Osten, Wolfgang, Springer

Livre dans la base de données depuis 2014-05-10T18:55:41+02:00 (Zurich)
Page de détail modifiée en dernier sur 2023-10-06T23:31:38+02:00 (Zurich)
ISBN/EAN: 9783642363580

ISBN - Autres types d'écriture:
3-642-36358-X, 978-3-642-36358-0
Autres types d'écriture et termes associés:
Auteur du livre: ost, osten
Titre du livre: frings, fringe

Données de l'éditeur

Auteur: Wolfgang Osten
Titre: Fringe 2013 - 7th International Workshop on Advanced Optical Imaging and Metrology
Editeur: Springer; Springer Berlin
976 Pages
Date de parution: 2013-08-29
Berlin; Heidelberg; DE
Imprimé / Fabriqué en
Langue: Anglais
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XXVI, 976 p. 620 illus.

BB; Hardcover, Softcover / Physik, Astronomie; Sicherheitssysteme und Brandmeldeanlagen; Verstehen; Ingenieurwissenschaften; Adaptive and Active Solution Strategies; Compressed Sensing; Computational Imaging; Digital Wavefront Engineering; Hybrid Optics; In-line Performance; Integration; Inverse-Problems Solution; Miniaturization; Model-Based Reconstruction Technologies; Model-Based Solutions; Multimodality; Real-Time Performance; Remote Technology; Resolution-Enhanced Technologies; Sensor and Data Fusion; Traceability; quality control, reliability, safety and risk; Security Science and Technology; Laser; Signal, Speech and Image Processing; Computer Vision; Laserphysik; Elektronik; Digitale Signalverarbeitung (DSP); Maschinelles Sehen, Bildverstehen; EA; BC

Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.
A comprehensive overview about the state of the art in modern optical imaging and metrology Written by the world leading experts in the field Combination of two disciplines: metrology and imaging

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