ISBN: 9783662083963
Although the first publication on lock-in thermography appeared in 1988 con cerning electronic device testing, this technique only became popular in the 1990s in connection with the nond… Plus…
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ISBN: 9783662083963
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Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials - nouveau livre
ISBN: 9783662083963
; PDF; Scientific, Technical and Medical > Mechanical engineering & materials > Materials science, Springer Netherlands
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ISBN: 9783662083963
Although the first publication on lock-in thermography appeared in 1988 con cerning electronic device testing, this technique only became popular in the 1990s in connection with the nond… Plus…
2003, ISBN: 9783662083963
*Lock-in Thermography* - Basics and Use for Evaluating Electronic Devices and Materials. Auflage 2003 / pdf eBook für 85.49 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Technik Med… Plus…
2003
ISBN: 9783662083963
Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials. Auflage 2003: ab 85.49 € eBooks > Sachthemen & Ratgeber > Technik Springer Berlin Heidelberg eBook a… Plus…
ISBN: 9783662083963
Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials: ab 85.49 € eBooks > Sachthemen & Ratgeber > Technik Springer Berlin Heidelberg eBook als pdf, Spring… Plus…
Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials - nouveau livre
ISBN: 9783662083963
; PDF; Scientific, Technical and Medical > Mechanical engineering & materials > Materials science, Springer Netherlands
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Informations détaillées sur le livre - Lock-in Thermography
EAN (ISBN-13): 9783662083963
Date de parution: 2013
Editeur: Springer Berlin Heidelberg
Livre dans la base de données depuis 2017-05-09T02:26:09+02:00 (Zurich)
Page de détail modifiée en dernier sur 2024-03-07T17:56:52+01:00 (Zurich)
ISBN/EAN: 9783662083963
ISBN - Autres types d'écriture:
978-3-662-08396-3
Autres types d'écriture et termes associés:
Auteur du livre: weingärtner, wilhelm martin, weingartner, langenkamp, breitenstein
Titre du livre: electronic devices, lock
Données de l'éditeur
Auteur: Otwin Breitenstein; Wilhelm Warta; Martin Langenkamp
Titre: Springer Series in Advanced Microelectronics; Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials
Editeur: Springer; Springer Berlin
195 Pages
Date de parution: 2013-03-09
Berlin; Heidelberg; DE
Imprimé / Fabriqué en
Langue: Anglais
85,59 € (DE)
88,00 € (AT)
106,50 CHF (CH)
Available
VIII, 195 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Elektronik; Verstehen; Experiment; Failure analysis; Lifetime mapping; Shunt imaging; Solar cell characterization; Trap density mapping; basics; imaging; integrated circuit; measurement; microscopy; thermography; C; Electronics and Microelectronics, Instrumentation; Measurement Science and Instrumentation; Optical and Electronic Materials; Nanotechnology; Engineering, general; Electronics and Microelectronics, Instrumentation; Measurement Science and Instrumentation; Optical Materials; Nanotechnology; Technology and Engineering; Engineering; Wissenschaftliche Standards, Normung usw. Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Nanotechnologie; Ingenieurswesen, Maschinenbau allgemein; BB
1. Introduction.- 2. Physical and Technical Basics.- 3. Experimental Technique.- 4. Theory.- 5. Measurement Strategies.- 6. Typical Applications.- 7. Summary and Outlook.- References.- A. Thermal and IR Properties of Selected Materials.- B. Digital Micrograph Scripts for FFT Deconvolution.- List of Symbols.- Abbreviations.This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. It provides the necessary knowledge on the scientific basics and application of this method. It appeals to electrical engineers, researchers and advanced students.
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