Scanning Electron Microscopy / Physics of Image Formation and Microanalysis / Ludwig Reimer / Taschenbuch / Springer Series in Optical Sciences / Paperback / xiv / Englisch / 2010 / Springer Berlin - Livres de poche
2010, ISBN: 9783642083723
[ED: Taschenbuch], [PU: Springer Berlin], Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The differe… Plus…
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2010, ISBN: 3642083722
Softcover reprint of the original 2nd ed. 1998 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Rasterelektronenmikroskopie; scanningtunnelingcrystal; diffract… Plus…
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) [Soft Cover ] - Livres de poche
2010, ISBN: 3642083722
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2010, ISBN: 3642083722
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Scanning Electron Microscopy / Physics of Image Formation and Microanalysis / Ludwig Reimer / Taschenbuch / Springer Series in Optical Sciences / Paperback / xiv / Englisch / 2010 / Springer Berlin - Livres de poche
2010, ISBN: 9783642083723
[ED: Taschenbuch], [PU: Springer Berlin], Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The differe… Plus…
Reimer, Ludwig:
Scanning Electron Microscopy Physics of Image Formation and Microanalysis - Livres de poche2010, ISBN: 3642083722
Softcover reprint of the original 2nd ed. 1998 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Rasterelektronenmikroskopie; scanningtunnelingcrystal; diffract… Plus…
ISBN: 9783642083723
Scanning Electron Microscopy ab 192.49 € als Taschenbuch: Physics of Image Formation and Microanalysis. Softcover reprint of the original 2nd ed. 1998. Aus dem Bereich: Bücher, Wissenscha… Plus…
2010, ISBN: 3642083722
[EAN: 9783642083723], Gebraucht, wie neu, [PU: Springer], Unread book in perfect condition., Books
Données bibliographiques du meilleur livre correspondant
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Informations détaillées sur le livre - Scanning Electron Microscopy
EAN (ISBN-13): 9783642083723
ISBN (ISBN-10): 3642083722
Version reliée
Livre de poche
Date de parution: 2010
Editeur: Springer Berlin Heidelberg
Livre dans la base de données depuis 2011-08-01T18:50:49+02:00 (Zurich)
Page de détail modifiée en dernier sur 2024-03-22T18:45:46+01:00 (Zurich)
ISBN/EAN: 9783642083723
ISBN - Autres types d'écriture:
3-642-08372-2, 978-3-642-08372-3
Autres types d'écriture et termes associés:
Auteur du livre: ludwig reimer, hawkes, ludwig reimers
Titre du livre: optical microscopy, science microscopy, scanning electron microscopy physics image formation and microanalysis, ludwig, englisch berlin
Données de l'éditeur
Auteur: Ludwig Reimer
Titre: Springer Series in Optical Sciences; Scanning Electron Microscopy - Physics of Image Formation and Microanalysis
Editeur: Springer; Springer Berlin
529 Pages
Date de parution: 2010-12-01
Berlin; Heidelberg; DE
Imprimé / Fabriqué en
Langue: Anglais
329,99 € (DE)
BC; Hardcover, Softcover / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Rasterelektronen Mikroskopie; Scanning Tunneling Microscopy; crystal; diffraction; electron microscope; electron microscopy; electron optics; microscopy; optics; scanning electron microscope; Spectroscopy; Condensed Matter Physics; Surface and Interface and Thin Film; Physics and Astronomy; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Mathematik und Naturwissenschaften; BB; BB; EA
provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.Autres livres qui pourraient ressembler au livre recherché:
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